Postgraduate Certificate in Microscale Characterization Techniques
-- ViewingNowThe Postgraduate Certificate in Microscale Characterization Techniques is a comprehensive course designed to equip learners with essential skills in advanced characterization techniques. This certificate course emphasizes the importance of understanding and applying modern microscale methods to analyze materials and devices at the nanoscale level.
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⢠Fundamentals of Microscale Characterization Techniques: An introduction to microscale characterization techniques, including their applications, advantages, and limitations.
⢠Scanning Electron Microscopy (SEM): This unit covers the principles, instrumentation, and applications of SEM for microscale characterization.
⢠Transmission Electron Microscopy (TEM): This unit explores the principles, instrumentation, and applications of TEM for microscale characterization.
⢠Atomic Force Microscopy (AFM): This unit covers the principles, instrumentation, and applications of AFM for microscale characterization.
⢠X-ray Diffraction (XRD): This unit examines the principles, instrumentation, and applications of XRD for microscale characterization.
⢠Raman Spectroscopy: This unit explores the principles, instrumentation, and applications of Raman spectroscopy for microscale characterization.
⢠Infrared Spectroscopy (IR): This unit covers the principles, instrumentation, and applications of IR for microscale characterization.
⢠Thermal Analysis Techniques: This unit examines the principles, instrumentation, and applications of thermal analysis techniques for microscale characterization, including Differential Scanning Calorimetry (DSC) and Thermogravimetric Analysis (TGA).
⢠Chromatography Techniques: This unit covers the principles, instrumentation, and applications of chromatography techniques for microscale characterization, including Gas Chromatography (GC) and High-Performance Liquid Chromatography (HPLC).
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